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Pragmatic Unit Testing in C# with NUnit, 2nd Edition

Authors: Andy Hunt, Dave Thomas, Matt Hargett
List price: $29.95
Amazon price: $18.49   Book details at Amazon.com
Average rating: 4.0 / 13 (13 reviews)
Publisher: Pragmatic Bookshelf (30 August 2007)

The NIST estimates that poor testing costs the US economy $60 billion annually. This book gives teams straightforward and proven ways to introduce unit testing into their process, resulting in higher quality and fewer bugs.

All over the world, software teams are using unit testing both to verify their code and as a way of helping them design better code. This book is unique in the way it covers two aspects: showing developers both how to test and helping them determine what to test.

New in the second edition:

  • Updated for NUnit 2.4 (.NET 2.0 and Visual Studio 2005)
  • More assert methods
  • New String and Collection assertion support
  • Better support for multiple-platform development
  • Higher-level setup and teardown fixtures
  • Whole new chapter on extending NUnit
  • and more!

Debugging Applications for Microsoft .NET and Microsoft Windows (Pro-Developer)

Author: John Robbins
List price: $59.99
Amazon price: $48.37   Book details at Amazon.com
Average rating: 5.0 / 12 (12 reviews)
Publisher: Microsoft Press (26 March 2003)

Learn lethally effective, real-world debugging techniques for Microsoft Windows operating system-based applications. This classic book has been updated with all-new coverage of .NET application debugging tools, techniques, and scenarios.

Testing Web Services Report

Authors: ZapThink, Jason Bloomberg
List price: $995.00
Amazon price: $995.00   Book details at Amazon.com
Average rating: 0 / 0 (0 reviews)
Publisher: ZapThink, LLC (23 August 2002)

Key Findings:

  • Web Services promise to fundamentally change the distributed computing landscape. This new landscape will present new testing scenarios and problems that companies using Web Services don't currently understand.
  • Today’s enterprises that are dabbling in Web Services aren’t inquiring about or requesting testing solutions.
  • The whole concept of a software development lifecycle will fall by the wayside as companies realize the advantages of orchestrating loosely coupled Services into coarse-grained business Services.
  • As enterprises follow the Web Services model and move from phase one (through 2003) to phase three (2005 and beyond) many testing issues will arise that the current simplistic approach to Web Services testing will not cover.
  • During phase one of Web Services adoption, Web Services are mainly just software components with SOAP interfaces.
  • The dynamic, "publish, find, and bind" capabilities of Web Services characterize phase two of the adoption of Service-oriented architectures.
  • In phase three, taking an agile approach to testing will make the most sense.
  • Vendors of Testing tools do not see Web Services as heralding an emerging market per se; rather, they generally see Web Services as a relatively small evolutionary step in the development of software components.
  • Test-first development will be a primary driver for Web Services testing. Test-first development, where developers assist in the creation of automated test plans before a line of code is written, has been proven repeatedly to lead to better code, written faster, that meets the needs of stakeholders better.

Table of Contents:

  • I. Report Scope
  • II. Context for Testing in the Web Services Model
  • 2.1 The ZapThink Web Services Roadmap
  • 2.2 Phase One
  • 2.3 Phase Two
  • 2.4 Phase Three
  • III. Web Services Testing Capabilities and Trends
    • 3.1 Web Services Testing in the Current IT Environment
    • 3.2 Software Testing Capabilities from Now into the Future
    • 3.3 The Software Testing Tools Market in the Web Services Model
    • 3.4 The Convergence of Service Orientation and Agile Methodologies
  • IV. Current State of the Market
    • 4.1 Web Services Testing Leaders and Followers
    • 4.2 Drivers for Web Services Testing Tools
    • 4.3 Barriers to adoption for Web Services Testing Tools
  • V. Conclusions
    • 5.1 Key Notes
    • 5.2 Decision Points
    • 5.3 Figures
    • 5.4 Tables
    • VI. Vendor Profiles
    • A. Related Research
    • B. Trademark Notice and Statement of Opinion
    • About ZapThink, LLC
  • ZapNote: Parasoft ZapNote: Testing both Web Services Producers and Consumers

    Authors: ZapThink, Jason Bloomberg
    List price: $9.95
    Amazon price: $9.95   Book details at Amazon.com
    Average rating: 0 / 0 (0 reviews)
    Publisher: ZapThink, LLC (17 July 2002)

    Developers must test their Web Services in many ways to insure that they are operating properly, including load testing, black box and white box functional testing, and regression testing. Parasoft’s Web Services testing tools perform the entire gamut of Web Services testing. In addition, Parasoft’s testing tools can emulate a Web Service so that developers can test their Web Service consumers. Because developers who are building Web Services must code both the Web Service producers as well as the Web Service consumers, Parasoft is one of the few testing tools on the market today that can provide developers with all the testing capability they need to fully test Web Services end-to-end.

    Web Services and Formal Methods: 5th International Workshop, WS-FM 2008, Milan, Italy, September 4-5, 2008, Proceedings (Lecture Notes in Computer Science / Programming and Software Engineering)

    Author:
    List price: $69.95
    Amazon price: $54.11   Book details at Amazon.com
    Average rating: 0 / 0 (0 reviews)
    Publisher: Springer (26 June 2009)

    This book constitutes the thoroughly refereed post-workshop proceedings of the 5th International Workshop on Web Services and Formal Methods, WS-FM 2008, held in Milan, Italy, in September 2008 in conjunction with the 6th International Conference on Business Process Management, BPM 2008.

    The 13 revised full papers presented together with one invited paper were carefully reviewed and selected from 39 submissions. The papers feature topics such as analysis, test, and verification; choreographies and process calculi; transactions and interoperability; workflows and petri nets.

    Neural network models of simple mechanical systems illustrating the feasibility of accelerated life testing (SuDoc NAS 1.15:107108)

    Author: Steven P. Jones
    List price:
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    Average rating: 0 / 0 (0 reviews)
    Publisher: National Aeronautics and Space Administration National Technical Information Service, distributor (31 December 1969)

    Net Test Automation Cookbook: Practical Lightweight Software Test Automation Techniques in a .Net Environment (Cookbooks (O'Reilly))

    Author: James McCaffrey
    List price:
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    Average rating: 0 / 0 (0 reviews)
    Publisher: O'Reilly Media ( 1 January 2001)

    Coder to Developer: Tools and Strategies for Delivering Your Software

    Authors: Mike Gunderloy, Sybex
    List price: $29.99
    Amazon price: $8.74   Book details at Amazon.com
    Average rating: 4.0 / 23 (23 reviews)
    Publisher: Sybex ( 9 April 2004)

    Are you ready to take the leap from programmer to proficient developer? Based on the assumption that programmers need to grasp a broad set of core skills in order to develop high-quality software, "From Coder to Developer" teaches you these critical ground rules. Topics covered include project planning, source code control, error handling strategies, working with and managing teams, documenting the application, developing a build process, and delivering the product. All of the techniques taught in this unique book are language and platform neutral, and were selected to help you effectively design and develop complex applications.

    Introduction to Multichip Modules

    Authors: Naveed A. Sherwani, Qiong Yu, Sandeep Badida
    List price: $132.00
    Amazon price: $19.74   Book details at Amazon.com
    Average rating: 0 / 0 (0 reviews)
    Publisher: Wiley-Interscience (23 November 1995)

    The first comprehensive text for the hot new multichip module technology

    Introduction to Multichip Modules is the first book to provide a comprehensive introduction to the technology of MCM-based electronic packaging—an innovation that has brought tremendous improvements in performance to computing systems of all kinds.

    A basic text and a professional reference in one, this book explores areas of relevance in both electrical engineering and computer science. It comes complete with review- and research-oriented problems, an extensive bibliography, and over 100 illustrations.

    Useful and instructive in many ways, Introduction to Multichip Modules:

    • Discusses the benefits as well as the problems arising from the compact packaging design of MCMs
    • Presents technical material in a systematic way, and supplements it with information on industrial developments and applications
    • Compares previous electronic packaging with the new technology in its discussion of the evolution of MCMs
    • Includes material relevant to diverse industrial segments, such as thermal management groups, CAD groups, electrical simulation, and interconnect analysis groups
    • Provides extensive technical information for designers of MCMs and MCM-based systems, while acting as a quick reference for CAD engineers involved in tool design for this technology.

    Ideal for university courses, Introduction to Multichip Modules can be used in advanced topics classes or research courses in multichip modules, electronic packaging, or CAD tools for MCMs.

    Multichip modules (MCMs) represent the latest in packaging technology for high-performance computing systems. Developed in response to advances in integrated circuit technology, especially VLSI technologies, MCMs' compact design of bare chips on multichip modules provides superior system performance and reliability, increased operating speed, and reduced system size and weight. At the same time, this design presents its own set of challenges and problems unlike anything in traditional, single-chip-module electronic packaging. These include excess heat, electronic noise, and new electronic phenomena occurring at higher operating frequencies.

    Introduction to Multichip Modules is the first book to provide complete coverage of the basics of this new technology for students and professionals alike. It covers all aspects of MCM, including classification, design, and CAD tools, and explains methods and materials used in the design of MCM-based systems. This book also examines the advantages and disadvantages of various types of design; demonstrates methods of improving system reliability; and discusses the advantages of MCMs over traditional packaging methods for electronic-based applications in computers, aviation, and the military. Introduction to Multichip Modules discusses both custom built MCMs and programmable MCMs and their role in reducing cost and improving turnaround time.

    An invaluable resource for students and professionals in electrical engineering who design MCMs and MCM-based systems, and for those in computer science who develop CAD tools for MCMs, this book is also useful to anyone who would like to know more about the evolution of this technology and where the new advances in the field may lead us.

    CODE Magazine - 2000 - Spring (Ad-Free!)

    Authors: Markus Egger, Rick Strahl, Yair Alan Griver, John V. Petersen, Barbara Peisch, Nancy Folsom, Steven Black, Rod Paddock
    List price: $3.99
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    Average rating: 0 / 0 (0 reviews)
    Publisher: EPS Software Corp./ CODE Magazine (15 April 2000)

    This is the ad-free version of this publication.
    This launch issue of CODE Magazine focuses on COM+, XML, DNA and VFP.
    Table of Contents:
    *) Welcome to Code Magazine!
    *) Loosely Coupled Events With COM+
    *) Using XML for Messaging in Distributed Applications (Part 1)
    *) Windows DNA Development: A Pattern Language
    *) The Importance of a ModernDevelopment Approach
    *) The Windows Scripting Host
    *) Customers vs. Code: Keeping Your Cool with the Essential Component
    *) String Processing With VFP
    *) Load Testing Web Applications using Microsoft's Web Application Stress Tool
    *) Comparing VFP String Performance to .NET String Performance
    For more information, visit www.codemag.com